Development Of Measurement System For Scintillator Decay Time Andlight Yield

The scintillation is the phenomenon of a substance that emits fluoresc-ence under the action of a particle with a certain energy,and this kind of sub stance is called the scintillator.According to the composition of the scintillator inate-rial,scintilator can be divided into organic scintillator and inorsganic scintilla-tor.And according to the state of the material,scintillator can be divided into gaseous scintillator liquid scintillator and solid scintillator.With the continuous development of photoelectronic technology,different kinds of scintillators can be combiined with a variety of optical detectors to adapt to different applications and physical objectives,thus scintillator gradually becoming one of the important de-tectors in uclear physics and partide physics experiments.Therefore.in high energy physics experiments,the scintillator is a very widely used detection mate-rial.In addition to high energy physics.scintillator is also widely used in safety testing.nuclear medicine,industrial injury,and other fields.In the experiments of nuclear and particle physics,the physical characteristics of the scintillator are described as the emission spectrum,the luminous efficiency.the luminous decay time,the luminous time and the light yield et.al.At present,various experi-ments around the world are not consistent with the measurement results of the light yield of the same crystal scintillator,which is related to the shape of the crystal scintillator,the location of the radioactive source,the treatment of the surface of the scintillator,the coupling between the scintillator and the optical detec tor device,and the performance of the optical detector.Therefore,accurate measurement of the decay time and light yield of the scintillator is complex and challenging.In this thesis,the main content is the scintillator decay time and light yield test system development.which includes a test system based on the photomultiplier tube(PNT)and a silicon photomultiplier(SiPM)based test system.For the PMT test system,the decay time measurement method is the Time-Correlated Single-Photon Counting Technology(TCSPCT)and the measurement of the decay time of the scintillator is compared with the single photoelectron.it is built on the basis of the commercial NIM modules.The SiPM based scintillator test system is built on the basis of CAEN SiPM kit SP5600AN.the light yield measurement also uses the single photoelectron comparison method,while the decay time measurement method is waveform analysis.The scintillators used in this study include Bismuth germanium oxide(BGO),Lutetium-yttrium oxy-orthosilicate((Lu,Y)2SiO5:Ce,LYSO(Ce)),Caesium iodide(CsI(T1))and Ce:Cs2LiYCl6(CLYC)which is studied by Institute of Crystal Material of Shan-dong University.At,present,the two test systems have been constructed,and the light yield of these four scintillators is characterized by using the SiPM-based test system,the preliminary results are obtained as well.