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A Study On The Polarization Characteristics Of Films Based On Mueller Matrix

Posted on:2021-02-23Degree:MasterType:Thesis
Country:ChinaCandidate:Q ZhaoFull Text:PDF
GTID:2370330626464995Subject:Optics
Abstract/Summary:PDF Full Text Request
At present,polarization detection technology has been widely used.If a beam of polarized light is reflected or scattered on the surface of an object,its polarization state will change,which is determined by the nature of the target itself.The Mueller matrix is used to describe the change in polarization detection technology.Thin films are an important class of materials,and are widely used in the fields of optics,optoelectronics,and microelectronics.Currently,Mueller matrix is also used in thin film technology to study the polarization characteristics and optical parameters of thin film materials.Therefore,based on the Mueller matrix,this paper studies the relationship between film polarization characteristics and film thickness.The specific work is as follows:1.According to the electromagnetic field boundary conditions and the principle of multi-beam interference,the reflection of light waves on isotropic and anisotropic films is analyzed,and the analytical expressions of the reflection coefficient and reflectance of the film are obtained,and then the expression of the Mueller matrix of the film reflection is obtained.The theory the relationship between the Mueller matrix of silicon-based Zn O thin film and the film thickness is simulated.2.Using a multi-rotating Mueller matrix measuring device,the TiO2 thin film,Zn O thin film,In doped Zn O thin film?IZO?,Ga doped Zn O thin film?GZO?and Ga-Al co-doped Zn O thin film?GAZO?of different thicknesses were measured respectively)'S Mueller matrix,The changes of the components of the five thin film Mueller matrices with the film thickness were analyzed,and the relationship between their depolarization ability,polarizing ability,bidirectional attenuation ability and film thickness was studied.The results show that as the film thickness increases,The GZO film is the most sensitive to changes in film thickness,and the depolarization ability and bidirectional attenuation ability are enhanced.The depolarizingability and polarizing ability of the Zn O film gradually increase,and the bidirectional attenuation ability first decreases and then increases.The depolarization ability of the IZO film gradually increases,and the polarization ability and bidirectional attenuation ability gradually weaken.The depolarization ability and polarizing ability of GAZO film are gradually enhanced,and the bidirectional attenuation ability is slightly enhanced and then weakened.The TiO2 film is least sensitive to changes in film thickness.
Keywords/Search Tags:Film Thickness, Polarization Detection, Mueller Matrix, Film Reflection Characteristics
PDF Full Text Request
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