Design And Development Of Test System Of Diode Detection Efficiency

The content of this paper mainly involves three aspects:analysis of principle about diode detection efficiency, software development of detection efficiency, and discussion on the test algorithm?Diode detection efficiency of current domestic test facing the main problem is, because of the complexity of the test parameters and diversity in operation of device, and analysis requirements for testing data, in the case of guaranteed accuracy, testers are very difficult to realize efficient test processes. However, diode detection efficiency is precisely an important indicator to measure the performance of the detector diode. In the production of semiconductor industry, it is particularly important for the screening process. So, to enhance the actual output efficiency of the semiconductor industrial production, realizing the automation of the diode detection efficiency test and data analysis show strong construction significance. Today, however, research on the test system of diode detection efficiency in our country is still in the midst of the backward phase. Based on the status quo of semiconductor test system research started late, small profit production, huge scientific research investment, high technical threshold is a series of thorny issues for the domestic research team. Therefore, the industry is weak, the overall competitiveness is more fragile; survival is difficult to maintain, they are more difficult to contend with foreign development strength, go round and round, and a vicious circle. I want to take the opportunity to design a practical diode detection efficiency testing system, based on years of working knowledge and experience in software and electronics, in order to solve the practical problems in the work.In this paper, according to the sequence of software development, from copyright verification to the design of each function module, and then to the executable program package, the final form of the installation file package. This paper focuses on the logic of software testing, data processing program, and the specific programming skills and experience.Lab VIEW software of this system makes the number of test equipment (SP2271 digital UHF MV table, F120 digital function waveform generator, Agilent 34401A digital multimeter, and digital signal control I/O card) organically unifies in together, to form a complete closed-loop feedback system through the serial port communication. Combined with the basic tuning algorithm, the setting of the test parameters, signal tracking, the screening, report generation, such as a series of data processing are realized. Not only to improve the efficiency of the test, saving a lot of manpower, but also refined, and precise parameters of the test conditions, to avoid the high error rate caused by the high accuracy of the data. From my development is completed and put into use to date has been five months long, by a previous test and tabulation, a retest and checking calculation of data reduction to today's just a test report, the rest of the all in program automatically. The unit workload consumed time is shortened by 85%, and there is no need to worry about will produce errors in the process of manual calculation.