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High-Power Microwave Test System Application Software Development And Design

Posted on:2016-02-11Degree:MasterType:Thesis
Country:ChinaCandidate:J T DongFull Text:PDF
GTID:2348330488474039Subject:Engineering
Abstract/Summary:PDF Full Text Request
With the continuous development of microwave technology, all kinds of high-power microwave devices are widely used in various fields of national economic development. It also puts forward to a higher requirement for high-power microwave device testing technology. It mainly embodies in the following two aspects, firstly can accurately measure the device parameters in large signal working condition, such as output impedance and reflection coefficient, secondly also pays more attention to the performance of test in integration, automation, data processing, etc. This paper researches the realization of the high-power microwave automatic test system. The core of the automatic test system is the microwave automatic tuner. The targets of automatic test system are to complete the measurement of microwave device parameters in the condition of high power, and to rapidly obtain each parameter value of devices in the optimal state.In this paper, the basic principle of the coaxial tuners is introduced. The traditional calibration and the fast calibration theory based on data fitting are analyzed. Several applications based on microwave high power automatic test system are presented, including the VCO frequency pulling test, tests of the output reflection coefficient of microwave power amplifier and the output impedance of the power transistor. The paper proposes several kinds of applications and corresponding schemes. The feasibility of schemes is demonstrated by the actual tests. The test application of transistor noise coefficient is studied, and the test procedure is presented. Test Center and Visual Studio are used to develop the software, the test software of the calibration module and several test application modules are completed. The software framework of automatic test system and the call of the software modules are realized, and the data processing is presented in the form of a chart.At this stage, the functions of the automatic test system are realized. The next step is to improve and perfect the test plans and software modules.
Keywords/Search Tags:Traditional calibration, Fast calibration, VCO, Power transistor, Reflection coefficient
PDF Full Text Request
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