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Aging Study Of InGaAs PIN Photoelectric Detector And ASE Broadband Source

Posted on:2015-07-18Degree:MasterType:Thesis
Country:ChinaCandidate:L F JinFull Text:PDF
GTID:2348330485494242Subject:Photonics technology
Abstract/Summary:PDF Full Text Request
Amplifed Spontaneous Emission(ASE) Light sources based on Erbium-doped Fiber and InGaAs PIN Photoelectric detectors have been applied in many fields. As a donor and accepter of the optical signal, the noise of ASE and detectcor plays significant role in the performance of the photoelectric system. During long-term operation the rise of noise will decrease greatly the authenticity of the output signal. To obtain the noise evolution in long-term operation, accelerated aging test is performed on these photoelectric components with long life and high reliability. Therefore, it is of great siganicant for noise evolution during accelerated aging test of ASE sources and InGaAs PIN photoelectric detectors.The main contents and structure of this article are as follow:1. Correlation theory and concepts are introduced, including the category and life distribution of accelerated aging test. On this basis, it gives a detail introduction on accelerated aging theroy of high tempertuer and space radiation.2. We discuss the nosie characteristic evolution and reliability data of InGaAs PIN detector in high temperture accelerated aging test. When the temperture is controlled in 358 K, the evolution law of detector noise opertating in 1488 hours is obtained. The output thermal noise increase about 20%, and 0.35% for dark current nosie. The backgroud noise will be about 20% more after the detectors work for 10.8 years. By comparing the variation of linear region before and after the experiment, 13.31% and 9.95% are shorten for two detectors. Moreover, the output noise model is modificated according to the analysis and the results of the experiments.3. The nosie evolution law and reliability data of ASE broadband source in accelerated aging test of high temperture and space radiation are studied. The scheme designed simulates the evolution of optical noise when the ASE sources operating at room temperture in 47616 hours with 343 K high temperture.The result is obtained that there is about 10.57(?V)2/Hz rapidly in declines for optical noise, and then, 5.18(?V)2/Hz slowly in rise. When analysising the relation between the optical power and noise, The coefficients of relative intensity noise ? and shot noise ? get more with the rise of temperture as well as output optical power. Furthermore, We design the experiment to research the evolution of optical noise with different radiation dose rates and the total radiation dose. The results show the whole power has declined due to the radiation, which has more effect to long wavclength than short wavelength. After that, by comparing the variation of optical noise in different radiation dose rates and the whole radiation dose, the noise show a trend that it increases firstly and then decreases with time at 0.083Krad/s and 0.0083krad/s. The noise variation in larger radiation dose rate is significantly faster than the smaller. The optical noise with radiation dose show the same trend like the noise with time, and it attain maximum at 2.5Krad.
Keywords/Search Tags:InGaAs photoelectric detector, ASE broadband source, Accelerated aging test, Noise, High tempertuer, Radiation
PDF Full Text Request
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