Research And Application Of Image Sub-pixel Measurement Based On Machine Vision

With the development of the traditional manufacturing industry, Industrial automation technology’s large-scale application. Especially in the semiconductor and consumer electronics industry, with the measurement precision, the products; quality, the detection speed needed is increasing. Require the detection device should have a high detection speed and detection precision. But simply increase the camera and the lens’ resolution to improve the detection precision, is not economical. So within a reasonable range, improve the detection precision of the method using the software is a very important development direction.This paper developed professional measure software, it can detect the size of the products and all kinds of defects in ROI areas. The software receives the detection signal from the PLC through the RS485, the results are sent to PLC through RS485, used to control the material receiving machine used to carries on the classification to the product. The taylor polynomial interpolation not depends on pixels’ coordinates, not sensitive to noise, also not sensitive to the change of the contrast of image. This paper combines the classical bilinear interpolation and Taylor-based sub-pixel interpolation to an improved taylor pixel interpolation algorithm. The algorithm has certain robustness for noise and slight variations in illumination.Copper cap(with needle) is a commonly electronic component used in the semiconductor electronics industry. It’s machining accuracy and quality are directly related to the final electronic product life and power consumption This paper led copper cap(with needle) measurement and defect detection project as an example, apply the improved taylor sub-pixel interpolation algorithm to cap’s inner diameter measurement and cone size measurement. Compared with the traditional bilinear Interpolation algorithm, the precision and stability have improved significantly.