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Design Of Pulse Measurement System For A New Resistive Switching Unit

Posted on:2017-02-14Degree:MasterType:Thesis
Country:ChinaCandidate:S H WangFull Text:PDF
GTID:2308330485982094Subject:Control engineering
Abstract/Summary:PDF Full Text Request
With the progress and innovation of semiconductor manufacturing industry, the re-quirement of consumer electronic products for low power consumption is further improved. No matter the access speed and the volume of production, Flash memory is more and more unable to meet the needs of the current demands, a new resistance variable memory has emerged. Its simple structure and fast access speed make the advantage more prominent. However, there are some reliability issues, such as program/erase unsuccessful and poor tolerance, which requires high accuracy and speed for testing facility.At present, there are two main problems in the commercial test module:high speed and low accuracy, or low speed and high accuracy, all of them can not satisfy the requirements of the test. And this commercial test module configuration of the host computer software interface is not friendly enough, cannot be deep custom drive waveform and other shortcomings, greatly reducing the test efficiency.Based on the above present situation, for the purpose of design fast, flexible and reliable test system of resistance variable memory unit, this thesis design and realize the test system of the resistance variable memory. The contents of this thesis are as follows:Firstly, through demand analysis, circuit principle design, software simulation verification, principle graph generation, PCB production process completed system hardware circuit, enable it to have the function of variable drive waveform generation and return signal with high speed and high precision measurement, can achieve tunable output pulse width 100ns~1ms, tunable amplitude+5V, DC mode voltage sweep of-5V-5V.Secondly, by debugging and optimizing the analog part of the circuit, we complete the circuit power supply system, the pulse output capability and voltage detection ability test and verify the stability and reliability of the circuit. Test results show that the speed of the waveform can reach 50 ns, the driving ability is up to 100 mA, and the detection accuracy is relatively high...
Keywords/Search Tags:Resistive memory, Test system, Simulation, SCH, PCB
PDF Full Text Request
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