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Research On The Key Technologies Of Fault Diagnosing, Maintaining And Avoidingof The IC Testing Equipment

Posted on:2017-02-19Degree:MasterType:Thesis
Country:ChinaCandidate:Q LiuFull Text:PDF
GTID:2308330482474663Subject:Mechanical design and theory
Abstract/Summary:PDF Full Text Request
Research and design of IC testing equipment troubleshooting system has the profound significance in the IC testing field. It is also the key technology to improve the performance of IC testing equipment. This paper first analyzes and summarizes the research status and problems of mature research methods. In order to increase the efficiency of IC testing equipment, this paper focuses on the research of troubleshooting. First of all, this article studys fault diagnosis of IC testing equipment by building a expert system based on fault tree analysis method. Then, by using case-based reasoning method, this paper introduces a system which can automaticly suggest the solution to a certain problem. With the record of design rational, this paper proposes a way to help engineers avoid fault in the period of design.In order to reduce the downtime of IC testing system, this paper contains the research of fault diagnosis, faults maintenance and failure avoidance. The specific contents are as follows:Fault tree modeling method is discussed, and a method of fault tree construction is proposed. By using this method, a fault tree model of IC testing device is built. Based on the analysis of the fault tree, the reason of failure can be limited in a set of minimum cutsets. With the establishment of a rule-based expert system, the minimum cutsets can be solved automaticly and rapidly.In order to increase fault maintenance efficiency, a kind of case-based reasoning method is proposed to help engineers reuse the solution to the case which is similar to current situation. By using case-based reasoning, the solution to a problem which has already been resolved can be found rapidly, and this solution will be adjusted be promoted other similar models.To help engineer avoid fault in the period of design, design rational information is recorded both synchronously and asynchronously. By taking DR information synchronously, the important information can be demonstrated in CAD software. By recording DR information asynchronously, engineers can understand each other better without communication.A text mining method is introduced, so that engineers will not need to enter DR information by manual operation.
Keywords/Search Tags:IC testing equipment, fault diagnosis, fault maintenance, failure avoiding
PDF Full Text Request
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