Design Of Integrated Circuit Aging Test System Based On FPGA

With the rapid development of semiconductor technology, electronic components, integrated circuit has been widely used in aviation, aerospace, military, industrial and industry products, so the reliability of electronic devices and integrated circuits becomes very important. The aging test is one of the most important reliability test, it must be in the appropriate test environment and give it various stress, for the test device status, aging experiments can make the products which have potential defect exposed before used. Aging experiment can reduce defective rate of products and increase the product reliability by eliminating part of the products that have potential defect to make performance of products into the stable interval before used. Especially in the military industry, aerospace industry and other industries that with high requirement on the reliability, aging test is a kind of means that can improve the reliability of the products.The paper completed overall design scheme of the aging system,based on the study of foundation in aging system theory, identified five main function modules:RS232 interface module,power amplitude exceeded detection module, DA conversion module, aselection circuit module and power of the aging system board supply module control, complete the hardware design of the circuit with FPGA as the core. This paper takes QUTERTUS as the platform and realizes the software programming of the system based on the DDS technology. After the debugging of the system, the system can provide Fang Bo, sine wave, triangle wave, before sawtooth wave and after sawtooth wave. The system complete the design target.In the end, the characteristics of the system are summarized and the improve scheme of the system is put forward.