RF IC Production Test System And Calibration Of System Development And Implementation

Today, High-performance and high level of integration is the main trend of thedevelopment of today’s semiconductor. As chip complexity increases, the requirements ofthe test system will be getting higher and higher, and the test cost also increases accordingly.The semiconductor industry faces fierce market competition, making the development ofhigh-performance and low-cost test machine has more practical and theoretical significance.The topic focuses on the urgent needs of the market and aims to develop a set of superiorand low-cost RF chip mass production test system.This paper mainly focuses on the design of RF test systems and its supportingcalibration system.Firstly, the thesis gives a recent research both at home and abroad, introducs the basictheory of semiconductor test and analyzes the advantages of the system compared tocomparable systems.Secondly, develop the calibration system. It includs three aspects:(1) Choose J750and PXI modular instruments based on the chip test requirements anddesign the architecture of hardware and software platform.(2)Develop RF control box according to specific circumstances of the measured RFsignals. Before development, theoretical research on error of principle in RF power test ismade and some methods of reduce measurement error in power testing are obtained.(3)Develop software platform of the test system including designing, development oftest flow, development of test items, optimizing test parameters and common actions(linkswitching,pin control,etc) using module class, development operation programs,designmentof test interface and so on.Thirdly, develop the calibration system.(1)Design the overall architecture of the calibration system and design calibrationprocess.(2)Develop GPIB program,optimize calibration parameter and common action in thecalibration and develop data storage capabilities.(3)Develop calibration items about the instruments and RF control box and developcalibration interface.Finally, study the performance of test system including the measurement error and uncertainty and analyse process capabilities about the device under test.This development proposes and implements the idea of low-end test machine plug-inRF instrument, generating RF test capability. It has important practical significance toreduce IC testing costs and improve our competitiveness in mass production test integratecircuits. It also proposes and realizes ideas of on-line EQC test in the development, whichgreatly facilitates the production test of tape and reel IC. During the development, classmodule design ideas are employed, which provide great convenience for programdevelopment, management, transplantation procedures and following system expansion.It should be noted that this paper selects the RF7168as an example, but it is suitable ofdigit,analog,memory test requires.This development is completed when the author works asa test and development engineer in actec semiconductor company in Zhenjiang. Thestructure of this paper is well organized based on the actual development ideas and itscontent mainly expounds some typical issues. The author hopes this form can better transfermore limited development experience to the readers.