A Cloning Based Accelerated Method For Soft Error Test Of Chip Multiprocessors

As Processdimension of the processors shrinking, integration of chips becomesincreasingly high, processors’ reliability is a chiefly factor to be considered. For avoidingthe soft error that result from energetic particles, the reliability test on soft error shall beaccomplished. This kind of test is costy on time and money, thus there is an urgent need ofaccelerating this procedure.The processors’ reliability on soft error appears differently among various binaries.The profiling information of the binaries and the reliability on soft error of the processorscan be got through the profiling procedure. The relation between them can be found tosearch the profiling information that results in low reliability on soft error. Then thebinaries’ profiling information can be controlled through the synthesis. These binaries canbe used in the test, and because of the high error rate they brought, there’s less time beforea visible error occurs. In this way the test of reliability on soft error can be drasticallyaccelerated.By analysising the SPEC and SPLASH2program series, the processors’ reliabilityresult from these binaries is not low enough to complete the test in a short time. Andthrough the binary code generating procedure, the code we have got can result in a prettylow reliability of the processors. Using these binaries, the cost of the test can be decreaseddrastically indeed.