Life Test And Reliability Growth Test Of LCD Module

With the development of LCD Module’s manufacturing technology, LCDmonitor, LCD TV have been widely used in people’s lives. At the same time,people have been requiring longer lifetime and better reliability of the mostimportant component of LCD products-LCD Module.This paper will introduce the structure, material, technological knowledgeof LCD Module. Via the high temperature life test and the Weibulldistribution methods, we try to get the Weibull distribution (Unreliability F(t)over Time) and probability density function f(t) of test LCD Module.Consequently, we could get the information about the products’ life.Then, via HALT test, which includes thermal stress, vibration stress, andcompound stress test, we find the potential failure factor of a type of LCDModule. Besides, we have made root cause analyzing and improving plan onthe potential failure, which was found in HALT test. Improvements on HALTin this paper improves the LCD Module’s reliability.High temperature life test and HALT test methods in this paper fit formost types of LCD Modules. High temperature life test’s advantage lies in that, it’s a exact failure time result, however, its disadvantage is that it costsquite long test time. HALT test’s advantage is that it costs short test time, butits disadvantage is HALT can’t record failure time. In this paper, we try to getthe advantage of the two test methods, in purpose of getting exact measurefailure time and improving reliability of LCD Module.