The Research On Reliable Detection Of Aging For Integrated Circuit

As the IC feature size scaling and the degree of integration improvingcontinuously, the cost of Electronic products drops ceaselessly and performance hasimproved obviously. However, the attendants are reliability problems of the system.For very large scale integration VLSI, two aspects have attracted the mostattentions: one is high performance, another one is high reliability. Highperformance requires the circuit must have a greater degree of integration,including increasing of the device density and multi-function integration. Highreliability requires circuit can continue work in high temperature, high pressure,high radiation and other harsh conditions. Soft-error tolerance and anti-agingmechanism are currently two hot spots in the field of circuit reliability research.This dissertation proposes a structure ESFF-SEAD（Flip Flop with EnhancedScan Capability&Soft Error&Aging Detection） based on the entry point ofsimilarities between soft-error tolerance and detecting mechanism of circuit aging,ESFF-SEAD can detect both soft errors and aging faults online, less than10%inhardware overhead but a good blend of two functions. The implementation ismaking an improvement on the hold latch of Enhanced Scanning Structure.ESFF-SEAD can switch modes in different application environments. Results ofHspice simulator illustrate the feasibility of the case.In addition, providing an error-correcting mechanism called SSCM(Signal-Selected Correction Mechanism) for circuit aging based on the ESFF-SEADthrough increasing an XOR gate and a multiplexer on the ESFF-SEAD structure.But we can correct the signal errors caused by aging faults differently.Last, this dissertation proposes a Low-Cost Signal-Violation Detector LSVDAwhich can detect three signal stability violations: soft errors, delay faults and agingdelays etc. LSVD has some capability of self-anti-aging and can also distinguishthe three kinds of target faults conveniently. This architecture has solved theproblem of detecting target fault separately in former research work. Experienceresults show that the architecture has great improvement in area, power comparedwith former research strategies.