Design Of Microcomputer Compensated Crystal Oscillator Automatic Measurement System

This thesis describes a new design of automatic testing system for MCXOs basedon C8051F061.This MCXO automatic test system consists of personalcomputer,MCXO,temperature chamber，a high-resolution frequency meter and controlcircuit board. The output of the frequency meter is used as the feedback signal toadjust the MCXO offset voltage.The change of working environment of the MCXO issimulated by changing the temperature of the chamber. This system can test severalMCXO’s (1to8) at the same time, It is also achieved the ability for fine-tuning ofaging, frequency tuning, data query, storage and others. So the automaticmeasurement of MCXO is realized It is introduced in detail the working principle ofMCXO automatic measuring system, the hardware structure of control board, thesoftware design of the host computer, host microcontroller and MCXO.The feasibilityof this MCXO automatic measurement system has been proved with a large amount ofexperimental results. In the temperature range (-40℃to+85℃.),±110~7frequency-temperature stability can be obtained.