Design And Realization On The Modular And Large-capacity Testing System

With the continuous development of the storage testing sysrem, it is widely used incomplex environment; the data which testing system recorded is increasing; the time ofproduct replacement is becoming shorting. The current testing system has the disadvantage ofsmall capacity power consumption, long development cycle and so on.The overall design of the testing system is designed on the basis of the research of thestorage testing system at home and abroad, throughing the analysis on the various technicalindicators and function of the testing system. The paper mainly describes the design andimplementation of the large storage testing system, and designs the system control unit to amodular unit. The rourth chapter of the article describes the system hardware design. Thebasic principles and theories of the testing system are described in the second chapter of thethesis. On the base of the basic and theories we use VHDL language to complete the modulardesign of each control unit in the CPLD, and use ModelSim simulation software to simulatethe timing functions,which including the A/D converter control module, the samplingfrequency adjustable module, FIFO buffer modules, FLASH memory soft-core module, USBcommunication module, and so on. The fourth chapter describes the hardware implementationof each module of the testing system, the system have been to achieve the desiredrequirements which been confirmed through the analysis of the data collected by the testingsystem. In the process of design, the control units in the CPLD have been to design to themodular unit. In future project development, modular units can be used directly by the design,greatly shorten the project development cycle.Finally, the inadequacies of the testing system are described in detail, and describe theprospect the testing system. At present, the FLASH memory system control soft-core, USBcontrol soft-core has been successfully applied to a project of the General ArmamentDeparment.