Embedded Flash Test

As is known to all, there is a very competitive market on sales of the memory IC chip. The majority of the FAB can have the capability on the manufacture of this kind of IC chip. From the current analysis trend of view, testing is one of the most valued key factors which will impact the price itself. Therefore, we need to take it into account on reducing the cost of the testing. Besides, we also need consider about how to improve the testing efficient as well as the testing reliability.The author of this dissertation works in the company which can supply the 0.13μm process Super Flash EEPROM. Base on the routine job, the author has summarized the huge engineering data in the hand, including the testing data on the parameters of new circuit or process design. The author always assists the related persons of Process Integration Engineering and Design Service Engineering, provide the related testing support and analyze each parameter whether it is within specification or meet the requirement of the mass production.Firstly, from the circuit design concern, the author lists the features of the several BIST design solutions, including the limitation of the pin counts, the functionality of the pins and also the advantage and disadvantage of the BIST circuit design itself. Base on the choice of the actual application, find out the best testing solution, the best testing methodology and the most reasonable testing parameters. Indeed, the author carried out a lot of analysis and study so as to make each one better understand the constraint between the testing methodology and the parameter so as to realize the whole procedure of the faults checking.Secondly, from the process feature concern, the author demonstrates the testing methodology, especially on how to analyze the writing operation of the embedded memory. Base on the theory of testing and practice in fining rune some process parameters, continuously improve the stability of device and expand the work area of the parameters of the process, with purpose to improve the yield eventually.Thirdly, from the production improvement concern, the author provide a series of testing methodology on how to reduce testing time, optimize testing program and enhance the testing coverage and yield.Finally, although the majority of the issues has listed out in this dissertation and solved at engineering period, not only these simple issues, but also the extend application, theory or hypnosis, hopefully can be further validated and come out the universal meanings afterwards. Meanwhile, it must help each one on actually application that all current testing methodologies listed out in this dissertation.