Expansion Of C/C++ Language Defect Patterns Oriented To Defect Testing System

A software testing technique based on defect pattern is a brand new method, which tests defects according to a predefined defect pattern. This pattern refers to syntax and semantic characters emerged from regular defects of programs. It is a description of program attributes, which will results in a defect as long as being violated. The research of defect pattern is a basic content of software test based on defect patterns. The more the software’s defect patterns are, the stronger the function of this testing system based on this technique will be.The defect testing system DTSCPP is a static source code analysis tool based on defect patterns, which can detect more than 100 defect patterns ranged in 4 categories. This thesis summarizes some defect patterns which cannot be detected by DTSCPP, so that we can broaden DTSCPP’s defect patterns and improve its testing capability.Through two experiments, we make summaries of defect patterns. First of all, we compared the defect reports of the same open source C/C++programs given by the advanced static analysis tool K8 and DTSCPP, then extracted out test cases which were not reported by DTSCPP, and summarized defect patterns; secondly, we researched test suites provided by NIST-SRD, and proceeded to find out defect patterns that were not reported.This thesis also analyzes the reasons that DTSCPP cannot report these defects, which can provide direction for DTSCPP’s improvement in the future.