Research And Implementation Of Software Defect Detection Technology Based On Extended State Machine

With the vigorous development of information technology and the frequent emergence of the software crises, the importance of software testing is obvious. As the important aspect of the field of seftware testing-static testing method occupy an important position because it can not run the program but only through the analysis on the source code. Software testing based on defect pattern is a new kind of source code static analysis technology, it has two advantages. One is that it is very pertinent to program defects; the other is that it can detect defects which happen in lower probability such as null pointer dereference.Software static analysis technology based on defect pattern mainly includes two parts. One is how to define the defect patern, and the other is how to design a unified and efficient detection framwork. Aim at the problem above, a method that uses extended defect pattern state machine to detect defects is given. The main contributions are as follows. Firstly, we research and implement the defect pattern state machine, mainly includes the basic structure, description rules and transition condition of state machine. At the same time, it gives some relevant research about path sensitive, infeasible path and procedural abstract which can enhance the result of static detection. Then, some concrete defect patterns are given and we design the detection algorithm on these patterns, mainly focus on how to apply the unified defect pattern state machine to practical applications.The defect detection system DTSCpp based on defect pattern uses our research for some defects detection, and the experiment shows that this system has satisfied testing result, and our research provides useful methods and approaches for the static analysis technology based on defect pattern.