Extension On The Defect Patterns Of Java Language Of Defect Testing System

Defect-based testing technology is the test based on the definition of defect patterns. The core of defect-based static analysis is the definition and detection of defect patterns. The more defect patterns the tool can handle, the potential ability of the tool can find defects is stronger.Defect Testing System (DTS) is a static code analysis tool based on defect patterns. DTS contains two different versions——Java and C two categories. Defect patterns in DTS include Fault Patterns, Safe Patterns, Question Patterns and Rule Patterns.Klocwork sofeware is a static analysis software similar with DTS. NIST (U.S. National Institute of Standards and Technology) test case library is a library aims at part of CWE ID. This thesis compares the Java code analysis results between DTSJava6.0 and Klocwork8, and extracts some test cases which relerant to the fault patterns of DTSJava from NIST test case library. According to the omission part of DTS, author summarized the defect patterns which DTSJava imperfectly define. These patterns will be extended in the new version of DTS.Through analysing the DTSJava scan results of thest test cases, author summarized the 11 kinds of defect patterns which DTSJava need to extend. Part of these patterns is what DTSJava has not defined, such as NPD_STAT, RL_PARAM. The other part is what DTSJava need to detail and add, such as NPD_PRE_CHECK.