Millimeter-wave Low-temperature Low-noise Receiver Front-end Components

As the development of millimeter-wave technology, millimeter-wave receiver front-end research is also in the rapid development. Millimeter-wave receiver front-end main devices include: low-noise amplifier, filters and mixers.In this paper, we will study the components of millimeter-wave low-temperature low-noise receiver front-end, and produce the low noise amplifier and band-pass filter. Low-noise amplifier and band-pass filter is the key components of receiver front-end. The performance of these components have a direct impact on the entire receiver system, just like: noise figure, selectivity, sensitivity, dynamic range and other key indicators. Some amplifiers items has a better noise and gain performance at low temperatures than room temperature; The band-pass filter that worked in low-temperature has better insertion loss than that in room temperature.In order to enhance system performance, the main studies of this paper are: millimeter-wave low-temperature low-noise amplifier chips used in the determination of the millimeter wave, choice of the band-pass filter coupled form and resonator.The main contents of this paper are:1. Design millimeter wave low-temperature low-noise amplifier, use MMIC chips micro-assembly processes, analysis the differences of HEMT, GaAs FET and p-HEMT. Determine the production of the Mimix company's XB1004 low-noise amplifier chips. And studied under different conditions of the assembly method of the chip to complete the optimum design.2. In accordance with the theoretical coupled resonant circuits to design the millimeter-wave bandpass filter, using open loop four resonator coupled to the design of the form of millimeter-wave band-pass filter produced, magnetic field coupling for mixed-coupling, and the use of IE3D electromagnetic (EM) simulation software on the millimeter wave band-pass filter for CAD design.3. Determine the low temperature (77K) test system, using liquid nitrogen refrigeration temperature of means testing. In line with the low-temperature test systems for each component and the overall design of the test 4. Complete circuit debugging features, use of the components of the millimeter-wave formation of a simple front-end to complete the relevant test. Analysis and summary of test results, compared the receiver front-end performance at room temperature and low temperature components.