Computer System Failure Mechanism Under High-power Microwave Research

Because the technology of high power microwave and anti-microwave is very important for national defense, study the high power microwave effect is necessary. The high power microwave can damage electronics system. The computer is core of electronics system, and the semiconductor component is basis of computer, so study it is very significant.In this study of high power microwave effect on the system of computer and semiconductor component, has two hands. One is experiment, the other is theory. The experiment is basis of theory, so be ignored. This paper mainly works at following several aspects.First,our aim is to build a high power microwave experiment system, with a computer taken as to experiment object. We can measure computer's threshold of interference and invalidation through experiment, and acquire the relation between HPM parameters and the threshold of computer invalidation. It is detected that the strength of field and the pulse width strong influence the threshold of invalidation in the experiment. The field is stronger, the pulse width is bigger, and then the threshold is lower.Second, in this paper the mechanism of HPM action is detailed explained, analyzes systematically the physical mechanism of typical semiconductor device's burnout and invalidation in environment of HPM. At the same time, the burnout mechanism of junction devise and MOS devise and some other devises under the high power microwave are discussed.The HPM action can come out through hot effect and the electricity effect, the semiconductor devise is burnout and invalidated, the hot effect raise the main function in the process. For the junction devises and MOS devises and other devises, the mainly damage mechanism is the effect of two times to broke through.