The Development Of High Power Semiconductor Laser Array Parameter Tester

Generally speaking, as to the measurement of the figures of High-power LD Array, the traditional way concerned a system made up of optical power meter, High quality driver, optical spectrograph. There existed some disadvantages in such systems: the large size, unavailability of continuous testing, the huge cost, and low level of automaticsize. Besides as the divergence angle of the LD array is wide while the port on common optical spectrograph is limited, It can not provide a accurate measurement.The testing system of High-power LD Array in this paper The system adopts thetechnology of high precise data sampling, strong data processing and the technology ofexact mechanical orientation. It can provide a accurate automatical test of plot power- current (P-I) curve, voltage-current (V-I) curve, spectrum curve and far-field curve ofLDThe main advantages of this system are:1. This testing system can test Laser Diode continuously. The testing speed reaches 3 Laser Diodes /min2. Driver of high reliability, avoided the unexpected damage during the test.3. Adopt the constant temperature platform with semiconductor cooler , made the result accuracy4.The system's software adopts Windows' style. It has friendly user interface, and it's easy to show, store, manage , and print the testing result.During the experiment, We have used this testing system to test dozens of Laser Diodes. The testing result shows that the system measures quickly, has highly precision and can be easily repeatedly manipulated.