Research On Spot Image Processing Of 4f Optical System Based On

Today, with the rapid development of optical technology, the measurement method of material nonlinear has diversified. No matter which way, the purpose is to better choose the ideal materials from a lot of materials. The Parallel double 4f coherent technique is widely used in the material nonlinear measurement because of its simple optical path, high sensitivity, stable performance, single pulse measurement, the beam space quality and low energy floating. This topic is mainly to research the light spot image processing system, the light spot image is based on 4f optical system, collected by CCD(Charged Coupled Device). The research of light spot image processing system can make the measurement more intuitive and clearer, easier for people to observe.In the research of speckle image processing algorithm, the main work of this subject is correction, denoising and feature extraction for spot image. Image correction is mainly on the geometrical position of light spot. The method of light spot image denoising adopts the multiple average spot image denoising. This method can protect the original information from damage, and effectively remove the noise. Feature extraction has two different methods, automatic iterative threshold method and manual method. This two methods can meet the different needs of researchers. Finally, integrate each part of the light spot processing algorithms into a graphical user interface(GUI).