Study On Testing Method Of Photoelectric Performance Parameters

In low light level imaging field, with the widespread of EMCCD, it is important to choose the appropriate parameter detection system in order to ensure the stability of detection system and rationality of imaging system. In some special cases, the parameters used in the practical application can not directly reference to the product manuals manufacturer provided. When EMCCD is used for a long time, some parameters may change due to the aging or other reasons, meanwhile, for military environments, the working conditions are extremely complex, and the environment is also different from the parameters measured with the product manual in such cases. Currently, domestic and international has not yet formed standards for performance parameters calibration and test.This paper introduces the structure and working principle of EMCCD and the performance testing methods of ordinary CCD (including the European Space Agency CCD test specifications and EMVA1288 standards). Then the definition of EMCCD photovoltaic performance parameters, parameter significance testing principles and other aspects are analyzed. Based on this principle, the test method of EMCCD photovoltaic performance parameters is proposed and a parametric test system is designed. The system consists of four parts, optical systems, electronics systems, cooling systems and computer measurement system. Wherein the optical system in part by the light source, a monochromator, integrating sphere, standard detectors and other components. Finally, the test platform to the imaging system performance parameters is built, and the test of EMCCD performance parameters completed. The value of Conversion gain is 1.803 e-/DNand full well capacity is 25770 e-,and results show that the quantum efficiency data is consistent with the product manual.In order to analyze the reliability of the test results quantitatively, the measurement uncertainty is studied and the international standard ISO/IEC Guide 98-3:2008 " Guide to the Expression of Uncertainty in Measurement ", referred to GUM method, is introduced combining with the error of EMCCD, standard detectors and other devices. The test system measurement uncertainty was evaluated, the results show that the quantum efficiency and optical parameters of the relative expanded uncertainty was 2.9% and 1.36%.