Research And Realization Of Test Scheme For High Co - Measurement Based On RFID Chip

RFID (Radio Frequency Identification), due to its characteristics of contactless and convenience, has been widely used in the fields like Identity card, transportation card, company secure card, etc. At present, RFID chip that is the most widely used is based on the ISO14443standard protocol which adopts the carrier frequency of13.56MHz. By receiving and sending RF signal via the antenna terminal, RFID implements to accomplish information communication with the reader. As the demand of RFID chip becomes larger and larger while the cost control stricter and stricter, the production test of RFID chip is usually required to accomplish not only the maximum testing capacity but also the minimum testing cost relatively. In order to achieve this goal, the parallel testing sites are increased to improve the testing capacity.Thesis researches high parallelism testing solution basing on ISO14443RFID chip. In T2000LSMF ATE testing system of ADVANTEST’s, RFID chip of64DUTs (Device Under Testing) parallel testing solution was implemented. The testing solution includes hardware design and test program development and solution to testing stability problems of64DUTs parallel testing in production.For hardware design, wafer performance board of64parallel sites testing has been designed and developed. Meanwhile, in order to generate ASK modulation waveform of26VPP which transmits to the RFID chip and accept the feedback signal of OOK modulation waveform from it, RFID application module has been designed and developed independently. The application module contains the two sets of amplification and attenuation circuits. The amplifier circuit is used with T2000LSMF’s arbitrary waveform to produced ASK modulation waveform needed. The attenuation circuit is used to reduce the output voltage from RFID chip to satisfy the measurement range of ATE’s comparator. For software, testing program and specific testing algorithms library aiming at ISO14443Ahave been developed.As mass production test highly requires testing stability, there are three key problems to be solved during the high parallelism testing:unsynchronized output data during the RF-IF protocol test, crosstalk between DUTs during RF-IF protocol test and testing accuracy of tiny capacitance between RF-IFs. This article has launched thorough analysis and researches for the foregoing three problems and has successfully solved them. In view of the output data is not synchronized of RFID chips, the way of memory store and calculation algorithm have been adopted. For the problem of crosstalk between the chips, by using coaxial needle on the probe card and testing algorithm optimize have well realized the improvement in production yield. According to testing data validation, small capacitance test has been achieved by CR method while testing accuracy well guaranteed.In the testing industry, it is the first time to realize the64DUTs parallel testing for RFID device in mass production via special designed RFID application module and ATE. Meanwhile, the64DUTs parallel testing is currently the most advanced technology. It has reference value to achieve low cost and high parallelism production testing solution to RFID devices.