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A Deflection And Vibration Measurement System Based On Ccd Imaging Sensor

Posted on:2011-08-02Degree:MasterType:Thesis
Country:ChinaCandidate:Q LiuFull Text:PDF
GTID:2198330338483534Subject:Photonics technology
Abstract/Summary:PDF Full Text Request
A measuring system based on a CCD image sensor, which can detect reflection and vibration frequency is described in this paper. This system is consist of a line array CCD image sensor, a Laser Level, a piece of High-speed digital signal processing chips, a piece of MCU chips and a long-distance wireless transmitter module. With the help of these components, the system is able to achieve the measurement of reflection and frequency at the same time online.The CCD sensor is fixed on the tested object and the beam from the Laser Level is focused on the surface of the sensor. When the tested object deforms, the CCD sensor will move as the object for they are fixed together, which results in relative displacement between the CCD sensor and the light spot focused on the surface of the sensor. The displacement and its frequency can be detected form the output signal of the CCD sensor by a High-speed digital signal processing system.Results of the experiments of deflection and frequency measuring are presented and these data indicate that the system achieves excellent linearity and stability. The relative error of deflection measurement is less than 1.7%, while the absolute error is less than 0.5 mm. The absolute error of frequency measurement is less than 0.1 Hz.
Keywords/Search Tags:deflection, vibration frequency measurement, laser measurement, digital signal process, Fast Fourier Transform
PDF Full Text Request
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