Efficient Ate Test Of Mixed-signal Test Solution And Realization

As the semi-conductor technology developing continuously and the market grow towards mature every day, the competition within devices of similar functions becomes ever fierce. Inevitably the cost control becomes more and more important. Testing is a major cost among all costs, therefore high-efficient ATE test solutions, plays a very important role in winning the market.Mixed signal test is commonly known as a time-consuming, parallel-incompatibility and noise-sensitive. In this paper the author will introduce a new mixed signal test solution through a project called"Lion"based on J750 ATE platform。The author will show that how the traditional PLL test and DAC test is improved by J750 test solution and how much time is saved as per this new generation ATE, as well as the improvement on test stability. This paper will also cover related PCB design technique of this new multi-site mixed-signal test solution。This new solution can provide great help for similar test projects.