Research On System Testing Of Hardware Drive Layer In Contactless IC Card

With the flourishing era of information is coming, contactless IC card is more and more widely used in our daily lives. New challenge of effectiveness and practicability of embedded software system testing method does exist. A high-level security protection has become the base. The hardware drive layer is located between the hardware layer and the user's COS. In the realization of individual hardware modules store or operation, it synchronously isolates the risk of attack to hardware resources from hackers. In this paper, we discuss about contactless IC card hardware drive layer system testing method, including on-line testing in the FPGA platform and regression testing method of sample cards.The unified model of testing of embedded software is introduced in this thesis, the characteristics of embedded software testing are analyzed, and domestic and international popular types of embedded software system testing and test methods have been studied. At the same time, the evaluation of embedded software security standards for CC in regard to testing requirements is also discussed, which provides with the theoretical basis of the hardware drive layer system testing method.According to actual situation of the hardware drive layer, system testing categories including functional testing, performance testing and recovery testing are confirmed. Functional testing is the most critical and most basic, while the performance testing and recovery testing is transaction processing rates and fault tolerance test for the hardware drive layer. Functional testing is the main use of dynamic testing methods (equivalence class partition method, etc.) to design test cases. At the same time, using the code walk-way in the static test method compensates for the use of dynamic testing methods which can not test to the circumstances. Hardware drive layer provides a variety of performance functions of ECC algorithms, etc. and large numbers operations (2048 data, multiplication, etc.). This paper uses OpenSSL package as a source of test data to ensure the designed functional test cases correctness in the expected input and output test data. Furthermore design methods of security function test case are taken into account from EAL4+ testing scope analysis, test-depth analysis and functional test.Sample cards regression testing methods have also been confirmed subsequently. On the basis of the actual situation of test circumstances and projects, a test architecture which is fit for online test and regression testing is selected. Methods of validating test results and bug management process which can validate some defective are put forward. System testing methods in this paper can be used widely in the system testing of contactless IC card hardware drive layers.