Font Size: a A A

The Design Of Hall IC And The R&D Of Hall Sensor Testing Apparatus

Posted on:2011-07-12Degree:MasterType:Thesis
Country:ChinaCandidate:H ZhangFull Text:PDF
GTID:2178360305964892Subject:Microelectronics and Solid State Electronics
Abstract/Summary:PDF Full Text Request
As one of most widely used magnetic sensor, hall sensor has wonderful application in the measurement of precision, industrial automation and home appliance, especially the automotive. With the development of IC industry, it is the increasingly high demand that will ensure accurate chip parameters and require high efficiency, so the tester becomes more intelligent. Some research on hall sensor has been made in the thesis, a switch-type bipolar hall sensor has been designed and analyzed. The tester for hall sensor which has been developed in the thesis can accurately measure the performance parameters of hall sensor.In chapter one, a brief overview of the importance and developmental status of analog integrated circuits is presented. Based on this, a number of mixed-integrated Hall sensor chips are developed. The principle, application and future development of hall sensors is described in detail.In chapter two, the structure of the hall sensor IC is analyzed. And three kinds of manufacturing processes have been compared. The principle of chopper technology using for eliminating the offset is presented in detail. The design technologies of the future hall sensor include chopper technology, auto-zeroing (AZ) and correlated double sampling (CDS), the micro-power technology with the clock control, programmable technology and spinning current technology. Through improving the structure of bandgap voltage reference source, a good temperature characteristics has been achieved. At the end of the chapter, a typical example about the application of the hall sensor is illustrated.In chapter three, an overview of the importance of the test on integrated circuit, the developmental status of the domestic integrated circuit and the necessity of R & D about hall device testing apparatus is given. A prototype of the tester has been developed successfully. The settlement program, the structure of the system and the circuit diagram are given as well as the process of program design. After validating the performance, the performance parameters can be test accurately. The tester is characterized by time-saving, low cost and intelligence. To meet the needs of users, the performance of filter is developed.
Keywords/Search Tags:hall sensor integrated circuit, chopper technology, the test system of IC, hall sensor tester
PDF Full Text Request
Related items