Test Failure Control And Research For Charge-pump And MOSFET

The study of failure mechanisms in final test is an important factor to be concerned for electronic devices and ICs. In this thesis, Final Test failure control of charge-pump and MOSFET were chosen as the target. First, the failure mechanisms of Final Test were analyzed and the various failure mechanisms caused by the process defects were also studied. Then, a new failure control strategy had been proposed by setting the failure control limit, which is obtained by data acquisition and analysis of failure distribution. Some steps like to monitor the accuracy of test by statistical distribution of tester's correlation test, to setup Poka Yoke at test station, to show the defect of each process station by analysis of the failure from Final Test, had been taken. In addition, the related software also had been introduced to simplify the complicated work of data acquisition. Based on the aforementioned methods, we setup the system of data acquisition and process analysis, which can prevent the test "escapee" effectively. Final Test became the important data source of improvement for each process involved in the previous fabrication procedure. The proposed final test control methodology had been recognized by customers. The test failure control proposed is also applicable for the other fields of integrated circuits and discrete devices.