A Research On The Methods To Improve The UIS Capacity For Power Mosfet Testing

The testing principle and the importance of MOSFET UIS (Unclamped Inductive Switching) are introduced in this article. Through the actual case study of a company, the relationship between UIS performance and the product quality is explained. The factors that impact the UIS performance are analyzed in details. Three methods to improve the UIS performance are introduced in the thesis, by improvement in contact process, reduction of Rb and changing the device design. The UIS capability and the test yield of 2 actual devices are successfully improved by the combination of those approaches.