Development Of The Grain X-ray Real-time Imaging Systems Base On PaxScan2520V Flat Panel Detector

With the development of the electron-ray technology and non-destructive testing,X-rayreal-time imaging equipment has been greatly improved. Research and development ofreal-time imaging technology through X-ray flat panel detector has now become a hot spot.However, due to its high cost, the flat panel detector has not been widelystudied and appliedin China. This essay focuses on the study of PaxScan 2520V panel detctor which is used todetect the flaws in the grain through X-ray. On the request of the customers, the releventhardware system and real-time X-ray imaging system are also developed.It studies the physical basis of x-rayd etection and the X-ray flat panel detector imagingprinciple and designs the real-time x-ray imaging system used in grain flaw detection, andevaluates the system's various character tables,all of which meet the detecting demand.The paper details the system's image calibrating and noise reducing function, putsdeviation of the process, inconsistent pixel response and the Dead and other major elementswhich affect the imaging quality under effective control, corrects the random noise inimagingandimprovestheengineeringframeintegralalgorithm.Defect feature extraction provides datafor intelligent identificationand evaluation,andis the theoretical foundation of automatic X-ray inspection. This paper takes a grain's X-rayimage as a study case, sums up the existing defect feature extraction technology, introducesthefuzzytheory, uses the generalizedmulti-level fuzzyoperatorenhancement algorithms andachieves edgeX-rayimagefeatureextractionwhichhasbeenprovedeffectiveinexperiments,layingasolidfoundationforbetterautomaticX-raydefectidentificationofthegrain.In summary, the X-ray real-time imaging system in this paper has met both theoreticaland practical demand .It enjoys great advantage compared with other imaging systems, but still with room of further improvement.