Development And Study On The Infrared Array Detection Platform

The technology of infrared thermal imaging detection is a new method of the non-destructive testing with the unique advantages such as no-touch, speediness, accuracy and intuitiveness. Based on the interior relationship among the infrared radiation of objects, surface temperature and the material character, the infrared radiation of the target objects detected by infrared heat sensors is transferred into a visible thermal image. It can be detected whether there are flaws within the object by analyzing the image.The essential component of the traditional infrared non-destructive testing system is the infrared thermal imaging device, which has high practical value in both the military and civilian applications. However, the infrared thermal imaging device is not fit for the common applications of industrial online detection because of its non-real-time and high cost. The paper is aimed at building a non-destructive testing platform which not only meets the industrial real-time detection, but also has the function of infrared non-destructive analysis.Firstly, based on the comprehensive analysis on the of infrared radiation theory and heat wave theory, the linear array probe group with high sensitivity thermopile sensor is made up, the adapter circuits are designed and weak infrared signals are magnified highly and acquired. Besides, self-calibration circuits are designed to adapt themselves to the different testing environment. Secondly, based on the infrared array detector platform, the impact of the thermal excitation source on the sample is analyzed. The symmetrical infrared lamb is used as heat excitation source to form a uniform temperature field on the sample surface. By active infrared non-destructive testing method, testing experiments with different flaws are made on the plexiglas and rubber board. Finally, different flaw signals are extracted and analyzed and the temperature-voltage curve and the infrared images are drawn. By analyzing and comparing the material defects parameters, an analysis report is made to provide a reference for the later experiment of infrared non-destructive testing.