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PUMA Device Final Test Development And Mass Production

Posted on:2009-10-04Degree:MasterType:Thesis
Country:ChinaCandidate:J ZhangFull Text:PDF
GTID:2178360272486952Subject:Electronics and Communications Engineering
Abstract/Summary:PDF Full Text Request
According to test system select, test load board hardware design and improvement, test code programming and debug, and final test result analysis with six sigma statistic method, experience the whole process for IC final test development, achieve PUMA IC mass production in TJN. Also it is the first time for Freescale TJN to finish the final test development by self. It provides more experience for us to face more new product introduction in future.In the PUMA final test development process, test program adopts GO-NO-GO test method to replace the old gradual approach method; test time gets big reduction, in the test load board design process, it is milestone to introduce new kind of relay (Eswitch) instead of old kind of relay. The task not only gets good result for cost reduction and make a point of doing benefit for the technical development, but also provides test time reduction good projects to solve related problem, this project level is ahead of test field so far.
Keywords/Search Tags:tester, handler, MIST, Eswitch
PDF Full Text Request
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