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Research On Methods Of Measuring Reflection Characteristic Of Surface

Posted on:2008-07-17Degree:MasterType:Thesis
Country:ChinaCandidate:B F HuangFull Text:PDF
GTID:2178360272469494Subject:Mechanical and electrical engineering
Abstract/Summary:PDF Full Text Request
Three dimension reconstruction from information in the image is one important research direction of computer vision. Shape from shading is one of the most important methods in three dimension reconstruction. SFS has wide application value in industry, medicine, space technology and so on,as restoring three dimension shape information just need one image. More and more attention has been taken to it. SFS method is based on the assumption of diffuse reflection model.But in reality the reflection model of most surfaces is a hybrid reflection model, thus it greatly restricts the widely use of SFS method. Researching reflection modle and separating difuse reflecton from the image is become a problem to be solved immediately in SFS method.Basing on analyzing current reflection models, measuring methods of reflection characteristic of surface is deeply researched in this paper. Reflection measure equipment was designed. Some of surface with typical reflection characteristic was measured with this equipment. It provides the separation of the difuse reflection and the specular reflection with strong technique support.Diffuse reflection, specular reflection and hybrid reflection were researched in this paper. Analyzing and comparing some typical hybrid reflection models, such as Phong model, Torrace-Sparrow model, Cook-Torrance model and Nayar model.LED was used as light source. Phototransistor was used to detect the Luminous intensity. Current-to-voltage conversion, amplification and filter circuits were designed. The display and analyze of measuring data are implemented with A/D conversion part of Lanjing information motion control card and series port communication.Measuring principle of reflection characteristic of surface was researched. The model of measuring system was figured out. Phong model was chosen in this paper. Then parameters of Phong model can be figured out through the data obtained using least-square method. Some typical reflectance surfaces was measured in this paperAn experiment equipment was been designed in this paper. Reflection model can ben measured by this equipment. Some surfaces with typical reflection characteristic were measured in this paper. It turns out that the measuring method is very available.
Keywords/Search Tags:computer vision, shape from shading, reflection model, diffuse reflection, specular reflction
PDF Full Text Request
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