Research On The Radiated Fields Of ESD Immunity Test Platform

Electronic equipment is made up of many integrated circuits. The application of integrated circuits and high-speed integrated circuits makes electronic products and circuits more sensitive to electrostatic environment. Almost all the electronic equipment (or system) will be required for ESD immunity test now. According to the standard, namely IEC61000-4-2 prescribed by IEC, the robustness of the electronic equipment can be evaluated, which just specifies few parameters of the current waveform. But the transient field is not specified in the IEC standard.Based on the immunity test platform stipulated in IEC61000-4-2, the transient fields of the indirect ESD through the horizontal or vertical coupling plane (HCP or VCP) are numerically simulated by using the FDTD method. The expression of discharge current with pulse function is embedded in the FDTD scheme. The transient fields of the indirect ESD through the HCP or VCP are numerically simulated. The computational results of different points on the testing plane above the HCP and VCP are given. In the process of the indirect discharge test, the VCP and HCP are just 100 mm away from the EUT. It is necessary to acquire the field value on the test plane from 100 mm away from the coupling planes. The comparison and analysis for time-domain waveforms and the spatial distribution of the electric and magnetic fields are implemented.In this paper, the relevant experiments are made on the set-up of electrostatic discharge immunity test for tabletop equipment, described by IEC61000-4-2. The measurement at the different discharge voltages is taken in the two indirect discharge methods. The comparison and analysis for time-domain characteristics and the spatial distribution of the electric and magnetic fields are accomplished. The computational data are compared with those measured by the testing system ultimately.