A Design Of Photoelectronic Parameters Measurement System Of Quadrantal Infrared Detector

Quadrantal infrared detector is a key part of many kinds of infrared system, whose parameters decide the character and quality of the whole system. So it is important to measure the parameters of the detector. By the study of the main ways and means to measure quadrantal infrared detector, we give out a suit of methods to design a measurement system of the quadrantal infrared detector, which makes it possible for the detector users get the accurate parameters of the detector easily with less time cost.The measurement system mainly achieves the parameters below: Responsibility, Under current, Capacitance, Homogeneity, Co-Disturbance. The system is composed by the laser set, optical system, circuit system, computer and several special measure instruments. As the controller of the system, the industrial computer is used to give out instructs and deal with the data from every instruments of the system.In the paper, firstly, the principle theory of the several parameters is discussed. Secondly, the measurement means are discussed and the appropriate ways are offered. At last, the design of the every part and the realization of these means is introduced, especially focused on the Laser, the optical system and the temperature controlling system.The run of the system indicates its veracity, reliability and the facility.