Research On Measuring Method Of Parameter Of Laser Holographic Anti-Counterfeiting Label

Playing a very important role in preventing forged product, laser holographic anti-counterfeiting technology which was the first anti-counterfeiting technology in our country is widely used as a label in fields of light industry products,the medicine,food,the cosmetics,the electronic product trademark, the negotiable securities, the confidential and the luxurious handicraft. At present, joining with other anti-counterfeiting technologies this technology is developing continually and has wonderful prospect.Laser holographic anti-counterfeiting technology has been introduced since the past 80's. With many years development, it gradually has already formed the scale. Although some national standards were promulgated for guaranteeing the quality of products, it was not good cause by the lack of measuring method and instrument; therefore, laser holographic anti-counterfeiting label lost its anti-counterfeiting feature. For this reason, solving this problem was urgent.This paper was focus on the research on the measuring method of parameter of laser holographic anti-counterfeiting label. At the first of paper, the feature and development of the laser holographic anti-counterfeiting was introduced. After that, the principle and manufacturing method were introduced preparing for the experiment. Using the useful data from the experiment a measurement instrument could be manufactured for deeper study and solving the problem. In the paper, machine structural,circuit and software of the instrument were explained.Measuring the label by using the instrument, this paper analyses the importance of the slit and some influencing factors for the measurement of SNR and diffraction efficiency.