In modern society, the electronic facilities are applied to not only the fields of technology such as test instruments, communication and automation, but also being necessary in people's daily life. As technology develops, the technology of fault diagnosis is becoming one of important approaches for guaranteeing normal to electronic facilities.The majority of faults in electronic facilities are in analog circuits, so the reliability of analog circuits nearly determines the electronic facilities' reliability. As analog VLSI develops, the analog circuits are becoming more integration and denseness, So the further research to the technology of fault diagnosis is a matter of great urgency.At present, the practicability and validity of method on fault diagnosis are researchers' topic. This paper designs a new approach based on the fault tree. The new method is based on the traditional methods, particularly DC fault dictionary.Applying the approach based on the fault tree to the fault diagnosis in analog circuits ,it turns out to be excellent. |