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Study Of Analog Circuit Testing Methods Based On Fault Dictionary

Posted on:2012-10-25Degree:MasterType:Thesis
Country:ChinaCandidate:G J XuFull Text:PDF
GTID:2348330503471740Subject:Navigation, guidance and control
Abstract/Summary:PDF Full Text Request
Analog circuit fault testing method is a theory of technology about the analog circuit fault diagnosis. The analog circuit components with the tolerance, non-linear and other reasons, makes the analog circuit fault testing more complex than digital circuits. So it develops relatively slowly, and the applications are not widespread. However, in a complete system, the digital circuit can not completely replace the analog circuit. The topic mainly studies the analog circuit testing methods, focusing on the key technologies of fault dictionary method and applying such research to the civil aviation airborne electronic equipment testing. So it is important to improve the safety and reliability of civil aircraft electronic systems.Firstly, the topic analyzes the development status of analog circuit fault testing method.With the basic principles and concepts of analog circuit fault diagnosis and with the classification of test methods,it focuses on the analysis of both AC and DC fault dictionary method. Then it selects the typical value of DC fault dictionary method for practical research.Secondly in the full study of traditional DC fault dictionary method, it carries out practical research of the key technologies in the dictionary method. It mainly includs two aspects: the one uses F statistics and dynamic fuzzy clustering analysis method to the traditional division of fuzzy sets; based on this fuzzy set, the other establishes the mathematical model ahout the optimization of test points, and proposes a new test point selection algorithm.Finally, after analysis of the traditional fault dictionary method and the improved fault dictionary method advantages and disadvantages, and with the actual air amplifier on board simulation, it successfully solves the traditional fuzzy set partitioning and optimization of test point selection problem. It improves the analog circuit system fault capabilities.
Keywords/Search Tags:Analog circuits fault diagnosis, Fault dictionary method, Dynamic fuzzy clustering analysis, Dynamic Programming, Pspice Simulation
PDF Full Text Request
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