Research Of Test System Of LD Characteristics Based On Vitrtual Instrument Technology

Semiconductor laser diode plays a more important role in the field of industry and research with the widely application of laser technology especially the development of optic communication. Use advanced test method to control the quality of LD is very important .Test system is expected to be more efficiency, intelligent, and integrated with the request of test. The openly design idea of virtual instrument afford an efficiency method for quicken the test and reduce the cost.In this paper, after studying the technology of virtual instrument and the characteristics of LD, we developed the LD test system using the design idea of virtual instrument。The system is mainly used for test the threshold current, differential efficiency, V-I characteristic and P-I characteristic of LD module. The hardware of system is used sensor and signal conditioning circuit to collect the signal and communication with the computer using the PCI2013 .For the undulation of temperature and driven current will influence the testing result, they need to be invariableness during testing. We provided ACC and APC two modes for the close loop controlling of current. Parameter fuzzy-PID is used to control the temperature. During running, computer deal with fuzzy rules and carry out the best adjust of PID parameters. We programmed with modularization idea of LabVIEW ,we achieved to set the test parameter, data acquisition , data processing and result display, communication with the optic testing instrument. We also achieved to drive no-NI DAQ and efficiency the system software by use multitasks.The article finished the whole testing instrument and the roundly detect. According the experiment result, the system can test the LD efficiency and display the result on the computer. The exactment and stability of current and temperature for the instrument is achieved the aim and meet the design requirement.