Wavelet Application Analysis On Defacts Detection

Defects are one of the important factors to affect the quality of the fabric finished. How to determine defect fabric and mark the defect location fast and accurately is a meaningful issue. From the practical point of view, this paper first discussed the wavelet-related knowledge related with the fabric defect detection, and then described in detail that the algorithm used in this paper processes, sub-section describes the image preprocessing, wavelet subgraph mapping, wavelet subgraph energy statistics and analysis, wavelet filter sequence nature of the impact test results, the choice of reconstruction subgraph, binary markers and other research results. Meanwhile,the article does a certain description and prospects on the background fabric defect detection research and development direction.This paper includes research within the next several aspects:1. By introducing adverse effects of fabric defects for the production and sale to propose the significance of fabric defect detection in practice. Also introduced the definition of some common defects which are relatively specialized in the following terms frequently used in the analysis process. Also provides domestic and abroad information of the development of defect detection techniques research to illustrate the value and significance to make a comparison reference.2. Introduce the knowledge of wavelet associated with fabric defect detection. The limitations of the Fourier transform is introduced leads to elaborate wavelet transform. The formation conditions of wavelet transform, scaling function and wavelet space structure to the continuous wavelet transform and discrete wavelet transform implementations of the theory of wavelets have been described and analyzed to prove the base of theory for the ideas and methods presented in this paper.3. Preparation methods proposed in this paper,the in detail,and theoretical basis of the treatment effect is given to make that figure on the theoretical analysis. The more important is to propose methods to determine the fabric defects. The wavelet subgraph mapping, the dynamic analysis of energy,etc are important reseach result which are going to be noted in this paper..4. Proposed the nature of the wavelet associated with fabric defect detection, in particular the nature of wavelet discrete sequence, which is very important theoretical materials related to the fabric defect detection is the theory basis of calibration method presented below. In the introduction of the mark process,first note the limitations of traditional Laws energy application methods,and then propose the binary segmentation defect location mark method combining automatic threshold segmentation method.