Research On The Reliability Of The Key Components For The Amplifier System In The SG-Ⅲ Prototype Facility

Reliability is the most important criterion to measure the stability of the ICF laser facility. It is the main quality attribute of the whole facility, and is directly associated with the system efficiency. The reliability depicts the ability of the laser facility to keep the normal operating state and to complete the designed functions. The developed countries consider the system reliability as important as the performance in ICF. Some countries even think that the reliability is prior to the performance.For the background listed above, this thesis investigates the reliability of the key components in the amplifier system, which is the core part of the SG-III Prototype Facility. This work is supported by the 863 project named "The reliability research of the large-scale laser facility" in China. The thesis summarizes the research findings.Firstly, the thesis investigates the reliability of the high energy density self-healing metallized film pulse capacitors and the capacitor banks, studies the degradation mechanism of the single self-healing pulse capacitor, and analyzes the reliability of screening test, burn-in test, life testing. This paper presents four kinds of models to forecast the life of the capacitors. The characteristics of the four models are compared with each other. Among them, the B-S distribution is firstly used in the field about the capacitor. The Gauss-Poisson model brought forward by this thesis is a new kind of life model in the world.Secondly, based on the characteristic of pulse capacitors, this paper introduces the performance reliability of the metallized film pulsed capacitor banks, and discusses the estimate of performance reliability under two different conditions. The technique solves the problem of how to assess the reliability of capacitor banks in real-time, and provides the evidence for lifetime forecasting and device maintaining.At last, the thesis analyzes the reliability of the high power large-bore pulse xenon flashlamps. The research contents include the effect that the tubing and the inner seal techniques act on the inherent reliability of the xenon flashlamps, the operational reliability of the xenon flashlamps improved by the pre ionization techniques and the design of the lamp house. This thesis also discusses the failure mechanism, life model and the failure rate of the high power large-bore pulse xenon flashlamps. The reliability of the xenon flashlamps is evaluated, and the sampling plan for the xenon flashlamps in the SG-III Prototype Facility can be provided by this thesis.