Research On The VI Based On LabVIEW And Its Application In The Plate Thickness Monitor

The virtual instrument is a new way of measure instrument's development. Plate thickness monitoring system is a valuable subject. This paper researches the virtual instrument based on LabVIEW, and developes a plate thickness monitoring system .The paper includes six chapters.In chapter one, the development and characteristic of virtual instrument is summarized, the research status and significance of plate thickness monitoring system is analyzed.In chapter two, the demand of the system is analyzed, and the solution how to used Non-Ni's card in the LabVIEW is given.In chapter three, hardware platform of virtual instrument is studied. Based on the PC-DAQ system, the effect of some basic signal theory in choosing and setting the data collecting card is discussed.In chapter four, based on the LabVIEW, the problem of signal input and output on software is discussed, and the method is introduced taking oscilloscope and signal generator as an example.In chapter five, based on the LabVIEW, a plate thickness monitoring system is developed. The system can meet common requirement of blocking structure and good expansibility.In chapter six, all the work of this dissertation is summarized, and the future research work is prospected.