Yield Modeling And DOE In PCBA

This paper introduces the statistics applications in the yield control of Printed circuit board assembly from the building of Yield Modeling and the DOE for printing parameter optimization. First by the compare of four statistical models, the path analysis method model has been proved to be the optimum one for Yield Modeling, then by the DOE of three factors and three levels, we found the best parameters setting to ensure the stability of printing.