The defect chemistry of compounds in the InGaO3(ZnO) k (IGZO) system (k=1, 2, and 3) was investigated via analysis of the dependence of conductivity and thermopower on oxygen partial pressure (pO2) at high temperature (750°C), i.e., Brouwer analysis. Defect mechanisms were deduced based on the resulting Brouwer slopes for all the k-phases, the prevailing point defect species were proposed to be the Ga antisite defect (Ga·Zn ionically compensated by indium vacancies ;{primeprimeprime}_{In}})... |