A Study Of The Methods For Quality Analysis And The Approach For The Integration Of Quality Information In Multistage Manufacturing Process

In multistage manufacturing systems, the processing is usually complex and high cost. The product quality is influenced by variant unknown factors. The methods for quality analysis are discussed in this thesis. The integration technique for quality information of Multistage Manufacturing Process (MMP) is also presented. This research is funded by the National Natural Science Foundation project"Study on XML System Modeling of Dynamic Quality Information". The major part of research work can be included in following sections.The traditionary process capability index (PCI) can only be used to estimate simple process. The whole process capability can not be obtained. By the study of the relationship of PCI and Taguchi's quality loss function (QLF), a new concept - Multistage Process Capability Index (MPCI) is introduced. On the basis of quality loss extent, a quantitative relationship between the MPCI and the PCI is discussed. An ANOVA (analysis of variance) sampling plan is set up in semiconductor manufacturing to resolve the problem of multi-variation of the product quality in MMP.Variation is a standard of the product quality. The variation source of MMP is studied. On the basis of single process variation transmission analysis, an iterative model of MMP variation transmission is presented. A method to detect the variation source is discussed via the study of variation transmission rules. By combining the rough set (RS) and variation transmission rules, a Dominance-based Rough Set Model is approached to analysis the MMP quality.Through the analysis of MMP information flow and the basic elements, an XML mode and the framework of MMP quality information is established. How to describe MMP quality information in XML is discussed. A new Procedure of information extracting from MMP-XML document is presented in detail.The actuality of enterprise information management system for semiconductor industry is analyzed. A framework of MMP quality analysis system (MMP-QAS) is established. It is well compatible with MES. In the project of XS-MES for Jiangyin Xinshun Microelectronic Co., MMP-QAS is integrated in the system.