Research On X-ray Thickness Gauge Based On Carbon Nanotubes

Starting from the actual application requirements and R&D needs of X-ray thickness gauges,this article has carried out in-depth research on the working principle of X-ray thickness gauges,the preparation of X-ray sources,the selection of X-ray receiving devices,and the software design of thickness measurement systems.Research and discuss.This article first describes the working principle and performance indicators of the X-ray thickness gauge,studies and analyzes the defects of the current domestic practical X-ray thickness gauge,and points out the design goal and direction of the X-ray thickness gauge in this paper;The advantages of the carbon nanotube cold cathode X-ray source in the application of X-ray thickness gauges are analyzed,and the preparation of the carbon nanotube X-ray source cathode is completed.The preparation process of the X-ray source is optimized and the final shape is obtained.Based on this,the X-ray source has been packaged;the X-ray receiving device has been analyzed and comprehensively compared,and the selection of X-ray detectors and digital pulse processors has been completed.Type;the software part of the X-ray thickness measurement system is designed,mainly including the parameter setting module and the thickness monitoring module;finally,the carbon nanotube X-ray thickness gauge is assembled and tested,and the test result is the X-ray thickness measurement developed on the surface The instrument reached the design goal.The main conclusions obtained are as follows:(1)The carbon nanotube array prepared by the microwave plasma-enhanced chemical vapor deposition method after process optimization is used to prepare the carbon nanotube X-ray tube cathode with ideal morphology and emission performance.It has passed the field emission performance test.The results show that the prepared carbon nanotube X-ray cathode has a turn-on voltage of 1.49 kV,a maximum emission current of 225?A,and a current density of 34.3A/cm2.On this basis,the packaging of the X-ray source is completed.(2)Aiming at the X-ray receiving device and data processing module of the X-ray thickness gauge,through the analysis and comparison of commonly used X-ray detectors,this paper finally selects the SDD detector with high resolution,no cooling,and compact size,digital pulse The processor selects DPP2 type,which can realize the functions of signal amplification,filtering and AD conversion.(3)In the software design process of the X-ray thickness measurement system,the parameter setting module and thickness monitoring module are first designed.The parameter setting module realizes the function of setting parameters and measuring the X-ray spectrum before and after the incident.The thickness detection module can Select the calibration curve and measure and display the thickness results in real time.(4)After completing the hardware system preparation,selection and software system design and debugging of the X-ray thickness measurement system,the X-ray source,high-voltage power supply,X-ray detector,and digital pulse processing of the carbon nanotube X-ray thickness gauge The detector,the stabilized power supply of the detector and the upper computer were assembled.After the assembly is completed,the X-ray thickness gauge transmission method measurement and the reflection fluorescence method measurement experiment and comparative analysis are carried out.The test results show that the designed and prepared carbon nanotube X-ray thickness gauge has reached the expected thickness measurement effect.