Research On The Design Of Hardened Latches Tolerant Of Multiple Node Upsets

In nanoscale CMOS process technology,the increasing system complexity,the dramatic reduction in device size,and the circuits more susceptible to single-particle effects,making them less resistant to radiation and increasing the probability of soft errors.As a result,the reliability of integrated circuits becomes a particular concern.Single Node Upset(SNU)induced by high energy particles is the main source of soft errors in timing components.However,under the influence of charge sharing,a single energetic particle impact can also lead to Multiple Node Upset(MNU).The most common ones are Double Node Upset(DNU),Triple Node Upset(TNU)or Quadruple Node Upset(QNU).The original hardening scheme for SNU can no longer meet the need for reliability of ICs in special environments.In order to improve the reliability of circuits,it is of great practical importance to design latching devices that are hardened for MNU problems caused by single-particle effects.In this paper,we carry out design research on hardened latches tolerant to multi-node flip-flops,and propose two TNU selfrecovery latches and one QNU self-recovery latch,with the following main work.(1)For TNU problem,this paper proposes the TNU Completely self-Recoverable(TNUCR)latch,which consists of a C-cell and an inverter cross-connected to form multiple feedback loops,and due to the special working principle of the C-cell,the latch can achieve TNU selfrecovery in addition to TNU fault tolerance.Simulation experiments show that the comprehensive performance of the proposed TNUCR latch is improved by 41.05%compared with the latest TNU self-recovery LCTNURL latch due to the use of clock gating technology.Secondly,this paper proposes the Low-Cost TNU Completely self-Recoverable(LCTNUCR)latch,which consists of ten C-cells forming a multi-stage filtered circular structure that allows the latch to self-recover from any possible TNU.Simulation experiments show that the LCTNUCR latch has a slightly larger area but has a lower transfer delay than the proposed TNUCR latch.Compared with the LCTNURL latch,the comprehensive performance of the proposed LCTNUCR latch is improved by 71.30%.(2)For QNU problem,this paper proposes the Low-Cost QNU Self-Recoverable(LCQNUSR)latch,which consists of a C-cell and an inverter,and makes full use of the interlock feedback loop and the fault-tolerance property of the C-cell to achieve QNU tolerance and self-recovery.Based on this design,using both high-speed transfer path and clock gating techniques,the proposed LCQNUSR latch reduces the area delay power product by about 88.89%compared to the LCTNURL latch with higher reliability.