Research On Resource Optimization Of Automatic Test System Based On Virtual Instrument

In recent years,automatic test system has been more and more widely used in scientific research,military and other fields.The traditional automatic test system has two defects: the call of instrument resources needs to be manually selected by the operator.When the operator has insufficient prior knowledge of the instruments in the system,the utilization efficiency of instrument resources is often low;In addition,in the traditional testing process,the data acquisition and analysis are processed by serial single thread.This processing method takes a long time and the utilization of computer CPU resources is low.In view of the above problems,this paper designs the automatic test system based on the board level circuit test and fault diagnosis project.This paper designs the signal instrument matching algorithm and the parallel processing model of producer consumer.The signal instrument matching algorithm matches the signal with the instrument through the signal ability of the instrument.Users no longer need to care about the specific configuration and operation mode of the instrument,but only need to input the characteristics of the signal,and the test system can automatically schedule and use the instrument;The producer consumer parallel processing model realizes the efficient utilization of CPU resources of multi-core processors through multithreading technology.The main work of this paper is as follows:1.Select the appropriate development environment,analyze the requirements and design the overall structure of the automatic test system,and develop and design a usable test software platform.2.According to the signal capability of the instrument,the instrument and signal are matched,and the matching degree is quantitatively analyzed.Then the scheduling design of the instrument is completed through the hash table.Finally,the instrument resource optimization algorithm based on signal instrument matching and instrument scheduling is realized to improve the utilization efficiency of instrument resources.3.The producer consumer model is applied to the test system to solve the problem of data loss caused by the inconsistency between data acquisition rate and data processing rate in the test process,and the thread safe queue is used to protect the data.Finally,the multi-threaded technology is used to complete the multi-task parallel processing and improve the utilization of CPU resources in multi-core processors.4.Design experiments to verify the module function of the automatic test system,and test the effect of instrument resource optimization algorithm and system CPU optimization algorithm.The experimental results show that the function of the test system is perfect,and the optimized system has higher utilization efficiency of instruments and equipment and computer CPU resources.